Authors:Liangjia Zhu, Stony Brook UniversityYi Gao, University of Alabama at BirminghamVikram Appia, Georgia Institute of TechnologyAnthony Yezzi, Georgia Institute of TechnologyChesnal Arepalli, Emory UniversityTracy Faber, Emory UniversityArthur Stillman, Emory UniversityAllen Tannenbaum, Stony Brook University
Date:2014
Publisher:Institute of Electrical and Electronics Engineers (IEEE)