Authors:E. J. Snider, Georgia Institute of TechnologyK. P. Kubelick, Georgia Institute of TechnologyK. Tweed, Georgia Institute of TechnologyR. K. Kim, Georgia Institute of TechnologyY. Li, Georgia Institute of TechnologyK. Gao, Georgia Institute of TechnologyA.T. Read, Georgia Institute of TechnologyStanislav Emelianov, Emory UniversityChristopher Ethier, Emory University