Authors:Morgan N. Greenleaf, Emory UniversityGregory L. Damhorst, Emory UniversityDavid N. Ku, Atlanta Center for Microsystems-Engineered Point-of-Care TechnologiesEric Nehl, Emory UniversityErika A. Tyburski, Atlanta Center for Microsystems-Engineered Point-of-Care TechnologiesOliver Brand, Atlanta Center for Microsystems-Engineered Point-of-Care TechnologiesGregory Martin, Emory UniversityWilbur Lam, Emory University
Authors:Marcelo Aguilar-Rivera, University of California San DiegoJulie Kable, Emory UniversityLyubov Yevtushok, OMNI Net Ukraine Birth Defects ProgramYaroslav Kulikovsky, OMNI Net Ukraine Birth Defects ProgramNatalya Zymak-Zakutnya, OMNI Net Ukraine Birth Defects ProgramIryna Dubchak, OMNI Net Ukraine Birth Defects ProgramDiana Akhmedzhanova, Khmelnytsky City Perinatal CenterWladimir Wertelecki, OMNI Net Ukraine Birth Defects ProgramChristina Chambers, University of California San DiegoTodd P. Coleman, University of California San Diego
Authors:Rebecca A Martin, Nova Southeastern UniversityGeorge Fulk, Emory UniversityLee Dibble, University of UtahAli Boolani, Clarkson UniversityEdgar R Vieira, Florida International UniversityJennifer Canbek, Nova Southeastern University
Authors:Hanlu Yang, University of Maryland Baltimore CountyTrung Vu, University of Maryland Baltimore CountyQunfang Long, University of Maryland Baltimore CountyVince Calhoun, Emory UniversityTülay Adali, University of Maryland Baltimore County
Authors:Seunghyeb Ban, Washington State UniversityYoon Jae Lee, Georgia Institute of TechnologyKa Ram Kim, Georgia Institute of TechnologJong-Hoon Kim, Washington State UniversityWoon-Hong Yeo, Georgia Institute of Technology
Authors:Jinhwan Kim, Georgia Institute of TechnologyAnthony M Yu, Georgia Institute of TechnologyKelsey P Kubelick, Georgia Institute of TechnologyStanislav Emelianov, Emory University
Authors:Jong S Park, Georgia Institute of TechnologySandra I Grijalva, Emory UniversityMoez K Aziz, Georgia Institute of TechnologyTaiyun Chi, Georgia Institute of TechnologySensen Li, Georgia Institute of TechnologyMichael N Sayegh, Emory UniversityAdam Wang, Georgia Institute of TechnologyHee Cho, Emory UniversityHua Wang, Georgia Institute of Technology
Authors:Cheng Ding, Emory UniversityTania Pereira, INESC TEC-Institute for Systems and Computer EngineeringRan Xiao, Emory UniversityRandall J Lee, University of California San FranciscoXiao Hu, Emory University